Biblio

Found 18 results
Filters: Author is Hocken, R.J.  [Clear All Filters]
2009
Amin-Shahidi D., Ljubicic D.M., Hocken R.J., Trumper D.L..  2009.  High-Accuracy Atomic Force Microscope for Dimensional Metrology. 24th Annual Meeting of the American Society for Precision Engineering.
Mazzeo A, A.J. S, Hocken R.J., Trumper D.L..  2009.  A Metrological Atomic Force Microscope. Precision Engineering: Journal of the International Societies for Precision Engineering. 33(2)
2008
Ljubicic D.M., Trumper D.L., Hocken R.J., Overcash J.L..  2008.  High Accuracy Atomic Force Microscope for Dimensional Metrology. 23rd Annual Meeting of the American Society for Precision Engineering.