Biblio
Found 18 results
Filters: Author is Hocken, R.J. [Clear All Filters]
High-Accuracy Atomic Force Microscope for Dimensional Metrology. 2010 IFAC Symposium on Mechatronic Systems.
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2010. High-Accuracy Atomic Force Microscope Probe and Measuring Machine. 25th Annual Meeting of the American Society for Precision Engineering.
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2010. High-Accuracy Atomic Force Microscope Using a Self-Sensing Probe. ASPE Spring Topical Meeting.
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2010. High-Accuracy Atomic Force Microscope for Dimensional Metrology. 24th Annual Meeting of the American Society for Precision Engineering.
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2009. A Metrological Atomic Force Microscope. Precision Engineering: Journal of the International Societies for Precision Engineering. 33(2)
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2009. High Accuracy Atomic Force Microscope for Dimensional Metrology. 23rd Annual Meeting of the American Society for Precision Engineering.
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2008. Control of a 2 DOF Long-range and 6 DOF Short-range Stages for Nanometer Positioning. ASPE Annual Meeting.
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2006. Atomic Force Microscope for Accurate Dimensional Metrology. ASPE Annual Meeting.
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2005. Early Testing of a Coarse/Fine Precision Motion Control System. ASPE Annual Meeting.
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2005. .
2004.
Dynamics and Control of the UNCC/MIT Subatomic Measuring Machine. CIRP Annals. 50(1)
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2001. The Long-Range Scanning Stage: a Novel Platform for Scanned-Probe Microscopy. Precision Engineering. 24(3)
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2000. Magnetically-Suspended Stage for Accurate Positioning of Large Samples in Scanned Probe Microscopy. 6th International Symposium on Magnetic Bearings.
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1998. A Longe-Range Scanning Stage (The LORS Project). ASPE Annual Meeting.
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1997. A Longe-Range Scanning Stage (The LORS Project). ASPE Annual Meeting.
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1996. .
1996. Magnetic/Fluid Bearing Stage for Atomic-Scale Motion Control. Precision Engineering. 18(1)
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1996.