The Long-Range Scanning Stage: a Novel Platform for Scanned-Probe Microscopy

TitleThe Long-Range Scanning Stage: a Novel Platform for Scanned-Probe Microscopy
Publication TypeJournal Articles
Year of Publication2000
AuthorsHolmes M.L., Hocken R.J., Trumper D.L.
Secondary TitlePrecision Engineering
Volume24
Issue3
Section191
Date Published07/2000