Biblio
Author: Hocken R
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A Long-Range Scanning Stage (The LORS Project)
2024ASME Journal of Dynamic Systems, Measurement, and Control1734050017
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High-Accuracy Atomic Force Microscope Probe and Measuring Machine
2024ASME Journal of Dynamic Systems, Measurement, and Control1734050017
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High-Accuracy Atomic Force Microscope Using a Self-Sensing Probe
2024ASME Journal of Dynamic Systems, Measurement, and Control1734050017
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High-Accuracy Atomic Force Microscope for Dimensional Metrology
2024ASME Journal of Dynamic Systems, Measurement, and Control1734050017
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Multi-degree-of-freedom Ultra-precision Motion Control Platform for Measurement of Nano-structures: A Course/fine Approach
2024ASME Journal of Dynamic Systems, Measurement, and Control1734050017
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High Accuracy Atomic Force Microscope for Dimensional Metrology
2024ASME Journal of Dynamic Systems, Measurement, and Control1734050017
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Control of a 2 DOF Long-range and 6 DOF Short-range Stages for Nanometer Positioning
2024ASME Journal of Dynamic Systems, Measurement, and Control1734050017
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Early Testing of a Coarse/Fine Precision Motion Control System
2024ASME Journal of Dynamic Systems, Measurement, and Control1734050017
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Atomic Force Microscope for Accurate Dimensional Metrology
2024ASME Journal of Dynamic Systems, Measurement, and Control1734050017
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Magnetically-Suspended Stage for Accurate Positioning of Large Samples in Scanned Probe Microscopy
2024ASME Journal of Dynamic Systems, Measurement, and Control1734050017