Biblio
Author: Overcash J
-
High-Accuracy Atomic Force Microscope for Dimensional Metrology
2024ASME Journal of Dynamic Systems, Measurement, and Control1734050017
-
High-Accuracy Atomic Force Microscope Using a Self-Sensing Probe
2024ASME Journal of Dynamic Systems, Measurement, and Control1734050017
-
High-Accuracy Atomic Force Microscope Probe and Measuring Machine
2024ASME Journal of Dynamic Systems, Measurement, and Control1734050017
-
High Accuracy Atomic Force Microscope for Dimensional Metrology
2024ASME Journal of Dynamic Systems, Measurement, and Control1734050017